Develop DFT strategy and architecture (e.g., hierarchical DFT, Memory Built-In Self Test (MBIST), ATPG).
Complete all Test Design Rule Checks (TDRC) and Design changes to fix TDRC violations to achieve high-test quality.
Insert DFT logic, boundary scan, scan chains, DFT Compression, Logic BIST, TAP controller, Clock Control block, and other DFT IP blocks.
Insert and hook up MBIST logic including test collar around memories, MBIST controllers, eFuse logic, and connect to core and TAP interfaces.
Document DFT architecture, test sequences, and boot-up sequences associated with test pins.
Requirements: Bachelor's degree in Electrical Engineering, a related field, or equivalent practical experience.
3 years of experience with Design For Test (DFT) methodologies, DFT verification, and industry-standard DFT tools.
Experience with ASIC DFT synthesis, simulation, and verification flow.
Experience in DFT specification, definition, architecture, and insertion.
Preferred qualifications:
Master's degree in Electrical Engineering.
Experience working with ATE engineers (e.g., silicon bring-up, patterns generation, debug, validation on automatic test equipment, debug of silicon issues).
Experience in IP integration (e.g., memories, test controllers, Test Access Point (TAP), and Memory Built-In Self Test (MBIST)).
Experience in SoC cycles, silicon bringup, and silicon debug activities.
Experience in fault modeling.
This position is open to all candidates.